Project centers in Chennai

IEEE Final Year Project Topic for CSE

Base Paper Title

A frequency domain SIM reconstruction algorithm using reduced number of images

Our Title

IEEE Project Abstract

Conventional 2D structured illumination microscopy (SIM) requires nine raw images to reconstruct a super-resolved image. In order to increase the frame rate of 2D SIM, attempts are being made to reduce the number of raw SIM images. However, all the proposed SIM reconstruction algorithms (SIM-RA) capable of reconstructing super-resolution (SR) image with a reduced number of raw SIM images operate in the spatial domain. Here, we present a frequency domain SIM-RA based on ordinary least squares technique, which enables reconstruction of SR image using four raw SIM images. Unlike the spatial domain RA, which produces the SR image through iterative convergence, the presented RA provides a single-step solution. It also reveals the fundamental limitation of least number of raw images required for resolution doubling in SIM.

IEEE Project Existing System

IEEE Project Drawback of Existing System

IEEE Project Proposed System

IEEE Project Advantage of Proposed System

IEEE Project Enhancement from Base Paper

IEEE Project Hardware & Software

IEEE Project Algorithm

IEEE Project Overview

IEEE Project Efficiency

IEEE Project Literature Survey

To View the Abstract Contents

Or Enquire Now !!!, WISEN Project Specialist will contact you soon.

Refer Your Friend
Refer Another Friend
Thanks for Referring Your Friend / Relation

Now it is Your Time to Shine.

Great careers Start Here.

We Guide you to Every Step

Success! You're Awesome

Thank you for filling out your information!

We’ve sent you an email with your Final Year Project PPT file download link at the email address you provided. Please enjoy, and let us know if there’s anything else we can help you with.

To know more details Call 900 31 31 555

The WISEN Team