Project centers in Chennai

IEEE Final Year Project Topics for CSE

Base Paper Title

External Patch-Based Image Restoration Using Importance Sampling

Our Title

IEEE Project Abstract

This paper introduces a new approach to patch based image restoration based on external data sets and importance sampling. The minimum mean squared error (MMSE)estimate of the image patches, the computation of which requires solving a multidimensional (typically intractable) integral, is approximated using samples from an external dataset. The new method, which can be interpreted as a generalization of the external non-local means (NLM), uses self-normalized importance sampling to efficiently approximate the MMSE estimates. The use of self-normalized importance sampling endows the proposed method with great flexibility, namely regarding the statistical properties of the measurement noise. The effectiveness of the proposed method is shown in a series of experiments using both generic large-scale and class-specific external datasets.

Existing System

Drawback of Existing System

Proposed System

Advantage of Proposed System

Enhancement from Base Paper

Architecture

Technology Used : Hardware & Software

Existing Algorithm

Proposed Algorithm

Advantages of Proposed Algorithm

Project Modules

Literature Survey

Conclusion

Future Work

To View the Base Paper Abstract Contents

Exclusive
Offer
Refer Your Friend
10%
CASHBACK
Refer Another Friend
Thanks for Referring Your Friend / Relation

Now it is Your Time to Shine.

Great careers Start Here.

We Guide you to Every Step

Success! You're Awesome

Thank you for filling out your information!

We’ve sent you an email with your Final Year Project PPT file download link at the email address you provided. Please enjoy, and let us know if there’s anything else we can help you with.

To know more details Call 900 31 31 555

The WISEN Team