Project centers in Chennai

IEEE Final Year Project Topics for CSE

Base Paper Title

Resistive RAM Endurance: Array-Level Characterization and Correction Techniques Targeting Deep Learning Applications

Our Title

IEEE Project Abstract

Limited endurance of resistive RAM (RRAM) is a major challenge for future computing systems. Using thorough endurance tests that incorporate fine-grainedread operations at the array level, we quantify for the first time temporary write failures (TWFs) caused by intrinsic RRAM cycle-to-cycle and cell-to-cell variations. We also quantify permanent write failures (PWFs) caused by irreversible breakdown/dissolution of the conductive filament. We show how technology-, RRAM programing-, and system resilience-level solutions can be effectively combined to design new generations of energy-efficient computing systems that can successfully run deep learning (and other machine learning) applications despite TWFs and PWFs. We analyze corresponding system lifetimes and TWF bit error ratio.

Existing System

Drawback of Existing System

Proposed System

Advantage of Proposed System

Enhancement from Base Paper


Technology Used : Hardware & Software

Existing Algorithm

Proposed Algorithm

Advantages of Proposed Algorithm

Project Modules

Literature Survey


Future Work

To View the Base Paper Abstract Contents

Refer Your Friend
Refer Another Friend
Thanks for Referring Your Friend / Relation

Now it is Your Time to Shine.

Great careers Start Here.

We Guide you to Every Step

Success! You're Awesome

Thank you for filling out your information!

We’ve sent you an email with your Final Year Project PPT file download link at the email address you provided. Please enjoy, and let us know if there’s anything else we can help you with.

To know more details Call 900 31 31 555

The WISEN Team